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Proceedings Paper

Shape measurement by speckle interferometry using holographic optical element
Author(s): Attila Nemeth; Janos Kornis
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Paper Abstract

Contouring by electronic speckle pattern interferometry is one of the most difficult measuring problems in the range of micrometers. The requirement of the position alignment of the master wavefront (smooth or speckled) and the wavefront of the test object by interferometric accuracy is always a difficult task and prevents the application of this method for quality controlling. To overcome the difficulties, in our paper a new two-wavelength method is presented.

Paper Details

Date Published: 13 August 1999
PDF: 7 pages
Proc. SPIE 3744, Interferometry '99: Techniques and Technologies, (13 August 1999); doi: 10.1117/12.357708
Show Author Affiliations
Attila Nemeth, Technical Univ. of Budapest (Hungary)
Janos Kornis, Technical Univ. of Budapest (Hungary)

Published in SPIE Proceedings Vol. 3744:
Interferometry '99: Techniques and Technologies
Malgorzata Kujawinska; Mitsuo Takeda, Editor(s)

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