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Proceedings Paper

Direct object localization and characterization from diffuse photon-density wave data
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Paper Abstract

In this paper we consider new methods for localizing and characterizing the structure of an anomalous areas embedded in an overall region of interest given sparse observations of diffuse photon density wavefields. Unlike traditional techniques which use the scattered field measurements first to form an image of the full region and then post-process the resulting reconstruction to localize areas of interest, our approach finds anomalies directly from the data. To accomplish this, we model the unknowns as a superposition of a slowly varying perturbation on a background of unknown structure. We assume that the perturbation is delineated from the background by a smooth perimeter which is modeled as a spline curve of unknown knot sequence. A greedy-type approach is employed to deform the curve in a manner which optimizes a cost function enforcing both consistency with the data along with a regularization term designed to reflect prior information we have concerning the likely structure of anomalies. As the algorithm progresses, we adaptively determine the optimal weighting coefficients describing both the texture of the anomaly as well as that of the background. Examples of this approach are provided for a diffuse photon density wave problem arising in a bio-imaging application.

Paper Details

Date Published: 15 July 1999
PDF: 10 pages
Proc. SPIE 3597, Optical Tomography and Spectroscopy of Tissue III, (15 July 1999); doi: 10.1117/12.356787
Show Author Affiliations
Misha E. Kilmer, Northeastern Univ. (United States)
Eric L. Miller, Northeastern Univ. (United States)
David A. Boas, Massachusetts General Hospital (United States)
Dana H. Brooks, Northeastern Univ. (United States)
Charles A. DiMarzio, Northeastern Univ. (United States)
Richard J. Gaudette, Northeastern Univ. (United States)

Published in SPIE Proceedings Vol. 3597:
Optical Tomography and Spectroscopy of Tissue III
Britton Chance; Robert R. Alfano; Bruce J. Tromberg, Editor(s)

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