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Proceedings Paper

Surfaces analysis based on subfringe integral method
Author(s): Iza Melao; Edison Goncalves; Mikiya Muramatsu
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Paper Abstract

This work shows the most used techniques for fringe analysis and presents a novel technique based on sub-fringe integral method with carrier frequencies, for phase retrieval. This method integrates one fringe into various subfringes to obtain the phase value. Several experiments were performed to obtain the information of flatness and profile from the surface to be analyzed.

Paper Details

Date Published: 19 July 1999
PDF: 2 pages
Proc. SPIE 3749, 18th Congress of the International Commission for Optics, (19 July 1999); doi: 10.1117/12.355011
Show Author Affiliations
Iza Melao, Univ. of Sao Paulo (Brazil)
Edison Goncalves, Univ. of Sao Paulo (Brazil)
Mikiya Muramatsu, Univ. of Sao Paulo (Brazil)

Published in SPIE Proceedings Vol. 3749:
18th Congress of the International Commission for Optics
Alexander J. Glass; Joseph W. Goodman; Milton Chang; Arthur H. Guenther; Toshimitsu Asakura, Editor(s)

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