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Proceedings Paper

Surface profiling of an absorber embedded in a dense medium by spatial integration of the backscattered light
Author(s): Toshiaki Iwai; Gaku Kimura
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Paper Abstract

The new method to reconstruct the 2D surface profile of an absorber embedded in a dense scattering medium is proposed in the report. The method is based on the fact that the intensity of the multiply-backscattered light integrated spatially by the detecting aperture with finite size is directly related with the optical path-length distribution. Experiments and Monte Carlo simulations confirm the potential and the availability of the proposed method.

Paper Details

Date Published: 19 July 1999
PDF: 2 pages
Proc. SPIE 3749, 18th Congress of the International Commission for Optics, (19 July 1999); doi: 10.1117/12.354978
Show Author Affiliations
Toshiaki Iwai, Hokkaido Univ. (Japan)
Gaku Kimura, Hokkaido Univ. (Japan)

Published in SPIE Proceedings Vol. 3749:
18th Congress of the International Commission for Optics
Alexander J. Glass; Joseph W. Goodman; Milton Chang; Arthur H. Guenther; Toshimitsu Asakura, Editor(s)

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