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Proceedings Paper

Two-wavelength interferometry based on a Fourier-transform technique
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Paper Abstract

Two-wavelength interferometry that is based on a Fourier- transform technique has been investigated. A phase profile at a synthetic wavelength has been obtained by the inverse Fourier transformation of a first-order frequency spectrum for (lambda) 1 wavelength and a minus first-order frequency spectrum for (lambda) 2 wavelength. A power- spectrum of the two-wavelength interferogram can be controlled to eliminate a phase error caused by the difference between modulation intensities at two wavelengths.

Paper Details

Date Published: 19 July 1999
PDF: 2 pages
Proc. SPIE 3749, 18th Congress of the International Commission for Optics, (19 July 1999); doi: 10.1117/12.354820
Show Author Affiliations
Ribun Onodera, Univ. of Industrial Technology (Japan)
Yukihiro Ishii, Univ. of Industrial Technology (Japan)

Published in SPIE Proceedings Vol. 3749:
18th Congress of the International Commission for Optics
Alexander J. Glass; Joseph W. Goodman; Milton Chang; Arthur H. Guenther; Toshimitsu Asakura, Editor(s)

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