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Proceedings Paper

Resolution and resolution improvement of passive millimeter-wave images
Author(s): Joseph D. Silverstein
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Paper Abstract

Measured and simulated passive millimeter-wave images of a simple target pattern were processed with Two-Mu, a linear, noniterative restoration algorithm. Decisions about whether the RAM pattern objects were sufficiently visible against a metallic background to be recognized were made by visually inspecting the images. This allowed quantitative measures to be made of the resolution improvement afforded by Two-Mu, as a function of scene oversampling for various target ranges and radiometer apertures. improvements by factors up to 1.25 and 1.45 were found for images and analog plots, respectively, of cuts through images, respectively.

Paper Details

Date Published: 14 July 1999
PDF: 15 pages
Proc. SPIE 3703, Passive Millimeter-Wave Imaging Technology III, (14 July 1999); doi: 10.1117/12.352999
Show Author Affiliations
Joseph D. Silverstein, Army Research Lab. (United States)

Published in SPIE Proceedings Vol. 3703:
Passive Millimeter-Wave Imaging Technology III
Roger M. Smith, Editor(s)

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