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Proceedings Paper

Characterization of MWIR thermal imaging systems
Author(s): Mike Davis; Robert L. Smith; Dave Grebe; Dale Kennard; Mike Long
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Paper Abstract

The development and subsequent production of Cincinnati Electronics Mid Wave Infrared thermal imaging systems has provided a significantly diverse set for system characterization. In this paper we describe measurement methodologies, results and modeled comparisons of the Noise Equivalent Temperature Difference and Minimum Resolvable Temperature Difference characterizations for three systems.

Paper Details

Date Published: 12 July 1999
PDF: 14 pages
Proc. SPIE 3701, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing X, (12 July 1999); doi: 10.1117/12.352973
Show Author Affiliations
Mike Davis, Cincinnati Electronics Corp. (United States)
Robert L. Smith, Cincinnati Electronics Corp. (United States)
Dave Grebe, Cincinnati Electronics Corp. (United States)
Dale Kennard, Cincinnati Electronics Corp. (United States)
Mike Long, Cincinnati Electronics Corp. (United States)

Published in SPIE Proceedings Vol. 3701:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing X
Gerald C. Holst, Editor(s)

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