
Proceedings Paper
Application of hardware-in-the-loop simulation to operational test and evaluationFormat | Member Price | Non-Member Price |
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Paper Abstract
The rapid advance of computer technology and advances in image generation and projection have provided unprecedented growth in the fidelity of hardware-in-the-loop (HITL) simulation. HITL simulation has improved to a level where it can support operational test and evaluation, often providing better insight into system performance than traditional open-air flight tests. This comes at a time of increasing open-air test costs and decreasing test budgets, two factors that are driving the movement for simulation based acquisition. We present two case studies on the application of HITL simulation to the operational test of the AGM-65 Maverick missile system. These studies demonstrate their fidelity of modern HITL simulation, highlight the benefits derived from this testing, and examine the cultural and technical impediments hindering the wider acceptance of simulation based acquisition efforts.
Paper Details
Date Published: 19 July 1999
PDF: 9 pages
Proc. SPIE 3697, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV, (19 July 1999); doi: 10.1117/12.352933
Published in SPIE Proceedings Vol. 3697:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV
Robert Lee Murrer Jr., Editor(s)
PDF: 9 pages
Proc. SPIE 3697, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV, (19 July 1999); doi: 10.1117/12.352933
Show Author Affiliations
David S. Cocanougher, 46th Test Wing/Guided Weapons Evaluation Directorate (United States)
Samuel A. Mirsky, 46th Test Wing/Guided Weapons Evaluation Directorate (United States)
Samuel A. Mirsky, 46th Test Wing/Guided Weapons Evaluation Directorate (United States)
Darrell B. Card, Marconi Services Corp./Guided Weapons Evaluation Facility (United States)
Published in SPIE Proceedings Vol. 3697:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV
Robert Lee Murrer Jr., Editor(s)
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