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Proceedings Paper

Nonuniformity correction of resistor arrays with a precision projector/sensor mapping method
Author(s): Mark A. Venables; Stephen Paul Lake; David W. Gough; Alan P. Pritchard
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Paper Abstract

We present a description of a new non-uniformity correction system for infra-red resistor arrays which has been designed to produce the maximum uniformity of output from neighbor pixels achievable, with a special emphasis on performance at low (ambient) output radiance levels. The system is based on a precision 1:1 mapping between the sensor and projector pixels, and utilizes an all-on approach for projector pixel illumination. The philosophy for system choices is presented, together with analyses and measurements. The system hardware is outlined, and measurements are presented from the system in use showing that at ambient levels, uniformity of better than 100 mK can be achieved between neighbor pixels. This corresponds to a uniformity deviation of some 0.35%.

Paper Details

Date Published: 19 July 1999
PDF: 8 pages
Proc. SPIE 3697, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV, (19 July 1999); doi: 10.1117/12.352920
Show Author Affiliations
Mark A. Venables, British Aerospace Ltd. (United Kingdom)
Stephen Paul Lake, British Aerospace Ltd. (United Kingdom)
David W. Gough, British Aerospace Ltd. (United Kingdom)
Alan P. Pritchard, British Aerospace Ltd. (United Kingdom)

Published in SPIE Proceedings Vol. 3697:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV
Robert Lee Murrer Jr., Editor(s)

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