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Proceedings Paper

Infrared scene projector characterization and sparse array nonuniformity correction (NUC)
Author(s): Kenneth R. Allred Jr.; Mark August Manzardo; David R. Anderson; Kenneth G. LeSueur; Eddie Burroughs Jr.
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Paper Abstract

The Redstone Technical Test Center (RTTC) has the requirement to project dynamic, infrared (IR) imagery to sensors under test. This imagery must be of sufficient quality and resolution so that, sensors under test will perceive and respond just as they do to real-world scenes. In order to achieve this fidelity from a pixelized infrared resistor emitter array, non-uniformity correction (NUC) is necessary. An important step in performing NUC is to calibrate the IR projection system so as to be capable of projecting a radiometric uniform IR image. The quality of the projected image is significantly enhanced by proper application of this calibration. To properly implement non- uniformity correction, it is necessary to accurately measure the radiometric emission of each element, or display pixel (emitter pixel), in the emitter array. This paper presents mathematical models and image-processing techniques required to successfully calibrate a non-uniform emitter projection system to absolute temperature. RTTC has developed a high- speed, reliable, and flexible means of digitally processing IR images captured from an emitter array. This method of evaluating IR imagery is also useful in performing sensor and overall projection system characterization. The purpose of this paper is to present the methods for correcting the absolute temperature non-uniformity of an IR resistor array.

Paper Details

Date Published: 19 July 1999
PDF: 12 pages
Proc. SPIE 3697, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV, (19 July 1999); doi: 10.1117/12.352918
Show Author Affiliations
Kenneth R. Allred Jr., ERC, Inc. (United States)
Mark August Manzardo, SPARTA, Inc. (United States)
David R. Anderson, ERC, Inc. (United States)
Kenneth G. LeSueur, U.S. Army Redstone Technical Test Ctr. (United States)
Eddie Burroughs Jr., U.S. Army Redstone Technical Test Ctr. (United States)

Published in SPIE Proceedings Vol. 3697:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV
Robert Lee Murrer Jr., Editor(s)

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