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Proceedings Paper

MIRAGE dynamic IR scene projector overview and status
Author(s): Stephen W. McHugh; Jon A. Warner; Mike Pollack; Alan Irwin; Theodore R. Hoelter; William J. Parrish; James T. Woolaway II
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Paper Abstract

The MIRAGE Dynamic IR Scene Projector is a standard product being developed jointly by Santa Barbara Infrared, Inc. and Indigo Systems Corporation. MIRAGE is a complete IR scene projection system, accepting digital or analog scene data as the input and providing all other electronics, optics and mechanics to project high fidelity dynamic IR scenes to the unit under test. At the heart of the MIRAGE system is the 512 X 512 microemitter array that incorporates many state-of-the-art features previously not available. The Read-In-Integrated-Circuit (RIIC) leverages technology from IR Focal Plane electronics to provide a system with advanced capability with low risk. The RIIC incorporates on chip DACs, snap-shot frame updating, constant current mode, voltage drive emitters and substrate ground plane providing high resolution and low noise performance in a very small package. The first 512 X 512 microemitter assembly has been received and was imaged on 2 APR 99. The complete MIRAGE system is currently in integration with the first deliverable unit scheduled for June 1999.

Paper Details

Date Published: 19 July 1999
PDF: 14 pages
Proc. SPIE 3697, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV, (19 July 1999); doi: 10.1117/12.352901
Show Author Affiliations
Stephen W. McHugh, Santa Barbara Infrared, Inc. (United States)
Jon A. Warner, Santa Barbara Infrared, Inc. (United States)
Mike Pollack, Santa Barbara Infrared, Inc. (United States)
Alan Irwin, Santa Barbara Infrared, Inc. (United States)
Theodore R. Hoelter, Indigo Systems Corp. (United States)
William J. Parrish, Indigo Systems Corp. (United States)
James T. Woolaway II, Indigo Systems Corp. (United States)

Published in SPIE Proceedings Vol. 3697:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV
Robert Lee Murrer Jr., Editor(s)

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