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Proceedings Paper

MIRAGE read-in integrated circuit testing results
Author(s): Theodore R. Hoelter; Blake A. Henry; John H. Graff; Naseem Y. Aziz
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Paper Abstract

This paper describes the test results for the MIRAGE read- in-integrated-circuit (RIIC) designed by Indigo Systems Corporation. This RIIC, when mated with suspended membrane, micro-machined resistive elements, forms a highly advanced emitter array. This emitter array is used by Indigo and Santa Barbara Infrared Incorporated in a jointly developed product for infrared scene generation, called MIRAGE. The MIRAGE RIIC is a 512 X 512 pixel design which incorporates a number of features that extend the state of the art for emitter array RIIC devices. These innovations include an all-digital interface for scene data, snapshot image updates (all pixels show the new frame simultaneously), frame rates up to 200 Hz, operating modes that control the device output, power consumption, and diagnostic configuration. Tests measuring operating speed, RIIC functionality and D/A converter performance were completed. At 2.1 X 2.3 cm, this die is also the largest nonstitched device ever made by Indigo's foundry, American Microsystems Incorporated. As with any IC design, die yield is a critical factor that typically scales with the size and complexity. Die yield, and a statistical breakdown of the failures observed will be discussed.

Paper Details

Date Published: 19 July 1999
PDF: 9 pages
Proc. SPIE 3697, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV, (19 July 1999); doi: 10.1117/12.352896
Show Author Affiliations
Theodore R. Hoelter, Indigo Systems Corp. (United States)
Blake A. Henry, Indigo Systems Corp. (United States)
John H. Graff, Indigo Systems Corp. (United States)
Naseem Y. Aziz, Indigo Systems Corp. (United States)

Published in SPIE Proceedings Vol. 3697:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV
Robert Lee Murrer Jr., Editor(s)

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