Share Email Print

Proceedings Paper

High-resolution imaging of heterogeneous surfaces with multifunctional NSOM
Author(s): J. Kerimo; M. Buechler; William H. Smyrl
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Imaging of surfaces and structures by NSOM has matured and is routinely used for studies ranging from biology to materials science. In the present paper, new developments will be emphasized that have resulted from the incorporation of a new technique for shear force feedback control of the scanning tip. The new technique involves the use of a quartz crystal tuning fork with the microscope, and this provides an open architecture for scanning tips. Thus not only is the normal optical contrast imaging done concurrently with topography imaging with optical fibers, but now one may substitute other tips such as nanoelectrodes for electrochemical imaging of reactive surfaces in concurrence with in-situ topography imaging. The modified instrument is now a multifunctional microscope that has many diverse applications.

Paper Details

Date Published: 19 July 1999
PDF: 25 pages
Proc. SPIE 10294, Optical Metrology: A Critical Review, 102940F (19 July 1999); doi: 10.1117/12.351663
Show Author Affiliations
J. Kerimo, Univ. of Minnesota/Twin Cities (United States)
M. Buechler, Univ. of Minnesota/Twin Cities (United States)
William H. Smyrl, Univ. of Minnesota/Twin Cities (United States)

Published in SPIE Proceedings Vol. 10294:
Optical Metrology: A Critical Review
Ghanim A. Al-Jumaily, Editor(s)

© SPIE. Terms of Use
Back to Top