
Proceedings Paper
Nonlinear absorption and laser damage threshold measurements of doped ZnGeP2Format | Member Price | Non-Member Price |
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Paper Abstract
Zinc germanium diphosphide (ZnGeP2) has proven to be an important nonlinear optical crystal for the generation of midwave infrared radiation, especially in an optical parametric oscillator configuration pumped by a Ho:YAG laser operating at 2.09 micrometers. Future applications will require higher intensity levels of the laser pump beam which are limited by the crystal's laser damage threshold and nonlinear absorption. These two quantities were measured for silver-doped ZnGeP2 samples of which was uncoated, two had conventional anti-reflection coatings, and one had an AR coating with a quintic refractive index profile. Prominent nonlinear absorption was observed in some of the crystals; the nonlinear absorption coefficient was found to be anisotropic and a weak correlation between the values of the linear and the nonlinear absorption coefficient was observed. The values of the nonlinear optical coefficients measured in these crystals for ordinary and extraordinary polarizations of incident light are reported along with the measured values of the laser damage threshold of these newly grown crystals at 2.09 micrometers, both in the AR coated and uncoated forms.
Paper Details
Date Published: 28 June 1999
PDF: 4 pages
Proc. SPIE 3793, Operational Characteristics and Crystal Growth of Nonlinear Optical Materials, (28 June 1999); doi: 10.1117/12.351408
Published in SPIE Proceedings Vol. 3793:
Operational Characteristics and Crystal Growth of Nonlinear Optical Materials
Ravindra B. Lal; Donald O. Frazier, Editor(s)
PDF: 4 pages
Proc. SPIE 3793, Operational Characteristics and Crystal Growth of Nonlinear Optical Materials, (28 June 1999); doi: 10.1117/12.351408
Show Author Affiliations
Shekhar Guha, Air Force Research Lab. (United States)
Mark Bartsch, Air Force Research Lab. (United States)
Frank Kenneth Hopkins, Air Force Research Lab. (United States)
Michael P. Eaton, Air Force Research Lab. (United States)
Mark Bartsch, Air Force Research Lab. (United States)
Frank Kenneth Hopkins, Air Force Research Lab. (United States)
Michael P. Eaton, Air Force Research Lab. (United States)
Scott D. Setzler, Sanders, A Lockheed Martin Co. (United States)
Peter G. Schunemann, Sanders, A Lockheed Martin Co. (United States)
Thomas M. Pollak, Sanders, A Lockheed Martin Co. (United States)
Peter G. Schunemann, Sanders, A Lockheed Martin Co. (United States)
Thomas M. Pollak, Sanders, A Lockheed Martin Co. (United States)
Published in SPIE Proceedings Vol. 3793:
Operational Characteristics and Crystal Growth of Nonlinear Optical Materials
Ravindra B. Lal; Donald O. Frazier, Editor(s)
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