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Proceedings Paper

Lithographically patterned superconductor bolometer detectors for visible and near-infrared radiation incorporating wavelength-selective light-absorbing elements
Author(s): Sara J. Eames; J. Seung-Jin Yoo; John C. Warner; Dean P. Neikirk; John Thomas McDevitt
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Paper Abstract

Composite dye/superconductor sensors which can discriminate different wavelengths of light in the visible and near- infrared regions have been fabricated. By lithographically patterning 1500 angstroms thick films of the superconductor YBa2Cu3O7 on MgO substrates, arrays of microbridges have been created. A layer of dye dispersed in a polymeric matrix is deposited on top of each bridge to create the wavelength selective light absorbing element. Each meandering path bridge is approximately 20 μm wide and approximately 10 mm long. The device functions in a different manner to traditional semiconductor-based light sensing technologies in which a dye structure serves the role of a filtering agent. Here, the response of the hybrid dye/superconductor element is amplitude at wavelengths strongly absorbed by the dye laser. Such devices represent the initial steps towards a larger structure capable of simultaneously sensing wavelength bands from the visible through to the infrared. In addition to dye sensitization method, another approach to adding wavelength selectivity to detectors is described here in which interference effects in micromachined microbolometers are exploited.

Paper Details

Date Published: 30 June 1999
PDF: 9 pages
Proc. SPIE 3790, Engineered Nanostructural Films and Materials, (30 June 1999); doi: 10.1117/12.351247
Show Author Affiliations
Sara J. Eames, Univ. of Texas at Austin (United States)
J. Seung-Jin Yoo, Univ. of Texas at Austin (United States)
John C. Warner, Univ. of Massachusetts/Boston (United States)
Dean P. Neikirk, Univ. of Texas at Austin (United States)
John Thomas McDevitt, Univ. of Texas at Austin (United States)

Published in SPIE Proceedings Vol. 3790:
Engineered Nanostructural Films and Materials
Akhlesh Lakhtakia; Russell F. Messier, Editor(s)

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