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Proceedings Paper

New IRFPA device model
Author(s): Glenn T. Hess; Davy Dai; Thomas J. Sanders; Gwendolyn W. Newsome; Theodore Fischer
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Paper Abstract

Existing infrared IRFPA models lack simplicity for setting up the detector's architecture/structure and lack continuity between IR detector material, IR detector processes, detector architecture, and detector operation. Existing models also lack the ability to reveal spatially and quantitatively the full impact of the detector's material, process and architecture on IRFPA performance. This paper discusses the development of a new IRFPA computer model used to simulate existing and future IRFPA's. This model is the first model that evaluates the IR sensor system at the device physics level and provides enhanced quantitative and visual information allowing the device engineer to determine the impact of material quality, processing procedures and IR detector architecture on IRFPA performance in the SWIR-VLWIR region. This new model is combined with powerful statistical techniques that predict IRFPA performance as well as cost. Operation under virtually unlimited user specified conditions allows the engineer to project the performance of a newly designed IRFPA prior to fabrication. The complete model provides outputs at both the device physics and detector level. When interfaced with NVESD's FLIR92 and ACQUIRE, the model provides the ability to analyze effects at the device level of the detector that impact outputs at the system level such as NETD and range.

Paper Details

Date Published: 22 June 1999
PDF: 11 pages
Proc. SPIE 3696, Enabling Technology for Simulation Science III, (22 June 1999); doi: 10.1117/12.351192
Show Author Affiliations
Glenn T. Hess, AET Inc. (United States)
Davy Dai, Florida Institute of Technology (United States)
Thomas J. Sanders, Florida Institute of Technology (United States)
Gwendolyn W. Newsome, U.S. Army Night Vision & Electronic Sensors Directorate (United States)
Theodore Fischer, Army Research Lab. (United States)

Published in SPIE Proceedings Vol. 3696:
Enabling Technology for Simulation Science III
Alex F. Sisti, Editor(s)

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