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Proceedings Paper

Development of novel magnetic field monolithic sensors with standard CMOS-compatible MEMS technology
Author(s): Salvatore Baglio; Laurent Latorre; Pascal Nouet
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Paper Abstract

In this paper novel Micro-Electro-Mechanical-Systems for magnetic field sensing are presented. These devices have been realized by using a micromachining approach which is fully compatible with standard CMOS technology. Several different structures have been developed and tested. Analytical system models have been defined in order to allow effective numerical simulation of the electro-mechanical system behavior. Both static and resonant working modes have been studied for different sensor architectures. Experimental results are reported regarding the metrological characterization of the devices. Particular attention has been also devoted to the effects of interfering inputs on the sensor output.

Paper Details

Date Published: 9 June 1999
PDF: 8 pages
Proc. SPIE 3668, Smart Structures and Materials 1999: Smart Structures and Integrated Systems, (9 June 1999); doi: 10.1117/12.350721
Show Author Affiliations
Salvatore Baglio, Univ. degli Studi di Catania (Italy)
Laurent Latorre, LIRMM/Univ. Montpellier II (France)
Pascal Nouet, LIRMM/Univ. Montpellier II (France)

Published in SPIE Proceedings Vol. 3668:
Smart Structures and Materials 1999: Smart Structures and Integrated Systems
Norman M. Wereley, Editor(s)

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