Share Email Print

Proceedings Paper

Scanning near-field optical microscopy (SNOM) with uncoated tips: applications in fluorescence techniques and Raman spectroscopy
Author(s): Gerd Kaupp; Andreas Herrmann; Gerhard Wagenblast
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The reflection-back-to-the-fiber SNOM under shear-force control with sharp and cold uncoated tips provides reliable submicroscopic resolution on rough surfaces without topographic artifacts. The high lateral resolution is the result of a sudden increase in reflectivity when the tip goes close to the surface at about 50% vibration damping. This technique has been tested for samples of piratical importance in the field of organic colorants and for Raman spectroscopy.

Paper Details

Date Published: 17 June 1999
PDF: 10 pages
Proc. SPIE 3607, Scanning and Force Microscopies for Biomedical Applications, (17 June 1999); doi: 10.1117/12.350632
Show Author Affiliations
Gerd Kaupp, Univ. Oldenburg (Germany)
Andreas Herrmann, Univ. Oldenburg (Germany)
Gerhard Wagenblast, BASF Aktiengesellschaft (Germany)

Published in SPIE Proceedings Vol. 3607:
Scanning and Force Microscopies for Biomedical Applications
Eiichi Tamiya; Shuming Nie, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?