Share Email Print

Proceedings Paper

Powerful pulse x-ray source for high-speed x-ray photography and other applications
Author(s): Alexandre V. Doubrowski; Vladimir A. Gribkov; Valery Ya. Nikulin; Pavel V. Silin
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Dense Plasma Focus (DPF) of a compact performance is proposed as a powerful X-ray source for various applications. The general property of DPF X-ray pulse is its short duration (t approximately 10 ns). DPF X-ray spectrum reached from zero to a few hundred kilo electron volts. Hard X-ray radiation (E equals 20 ... 100 keV) generated by the DPF device with energy storage about 3 kJ makes it possible to have an X-ray photo of any fast movable object for example rotating car wheel tire. A pulse hard X-ray radiation also can be used in the dynamic flaw detection. The combination of the pulse, energy, and spectral parameters of a DPF hard X-ray radiation allow to consider DPF as a device free from a competition for mentioned applications. A DPF soft X-ray emission (9 ... 14 Angstrom) can be used for X-ray lithography. This DPF application as well as mentioned above are tested experimentally with a success. Besides we have a plan to apply a DPF soft X-ray radiation for the diagnosis of a fast hot dense plasma process by means of radiography of another DPF during its action.

Paper Details

Date Published: 22 June 1999
PDF: 5 pages
Proc. SPIE 3516, 23rd International Congress on High-Speed Photography and Photonics, (22 June 1999); doi: 10.1117/12.350547
Show Author Affiliations
Alexandre V. Doubrowski, P.N. Lebedev Physical Institute (Russia)
Vladimir A. Gribkov, P.N. Lebedev Physical Institute (Russia)
Valery Ya. Nikulin, P.N. Lebedev Physical Institute (Russia)
Pavel V. Silin, P.N. Lebedev Physical Institute (Russia)

Published in SPIE Proceedings Vol. 3516:
23rd International Congress on High-Speed Photography and Photonics
Valentina P. Degtyareva; Mikhail A. Monastyrski; Mikhail Ya. Schelev; Alexander V. Smirnov, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?