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Proceedings Paper

Electron velocity overshoot in GaAs studied by subpicosecond Raman spectroscopy: carrier density dependence
Author(s): Kong-Thon F. Tsen
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Paper Abstract

Electron transient transport in a GaAs-based p-i-n nanostructure under the application of an electric field has been studied by transient Raman spectroscopy at T equals 80 K. The non-equilibrium electron distribution function and electron drift velocity were measured at an applied electric field intensity of E equals 25 kV/cm and for various injected electron-hole pair densities ranging from 1017 cm-3 to 1019 cm-3. Our experimental results show that, the electron distribution is very much out of equilibrium for n is congruent to 1017 cm-3; however, as the electron-hole pair density increase the electron distribution function approaches that of the equilibrium case, in particular, as the carrier density increases to n is congruent to 1019 cm-3, electron distribution becomes very much in equilibrium and electron drift velocity becomes almost zero. These results have been explained by the effects of momentum randomization and screening of effective electron field by the injected electron-hole pairs.

Paper Details

Date Published: 24 May 1999
PDF: 7 pages
Proc. SPIE 3624, Ultrafast Phenomena in Semiconductors III, (24 May 1999); doi: 10.1117/12.349305
Show Author Affiliations
Kong-Thon F. Tsen, Arizona State Univ. (United States)

Published in SPIE Proceedings Vol. 3624:
Ultrafast Phenomena in Semiconductors III
Kong-Thon F. Tsen, Editor(s)

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