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Proceedings Paper

Accurate refractive index measurements using computerized Schlieren and focusing methods
Author(s): Nicholas Ionescu-Pallas; Ionel Valentin Vlad; Ileana Apostol; Florian Bociort
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Paper Abstract

Two improved quantitative versions of the Schlieren and the focusing methods for the measurement of the refractive index proffle (RIP) in opttcal inhomogeneous axally-symmetric media are presented.

Paper Details

Date Published: 1 July 1990
PDF: 1 pages
Proc. SPIE 1319, Optics in Complex Systems, (1 July 1990); doi: 10.1117/12.34901
Show Author Affiliations
Nicholas Ionescu-Pallas, Institute of Atomic Physics (Romania)
Ionel Valentin Vlad, Institute of Atomic Physics (Romania)
Ileana Apostol, Institute of Atomic Physics (Romania)
Florian Bociort, Institute of Atomic Physics (Romania)

Published in SPIE Proceedings Vol. 1319:
Optics in Complex Systems
F. Lanzl; H.-J. Preuss; G. Weigelt, Editor(s)

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