Share Email Print

Proceedings Paper

Nondestructive evaluation of simulated and actual surface defects using a photoacoustic microscope
Author(s): Haruo Endoh; Yoichiro Hiwatashi; Tsutomu Hoshimiya
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Using the specimens of two types with simulated surface defect and the specimen with actual crack, the detection of the surface defect and crack has been demonstrated by photoacoustic microscope. The surface defect of the first type is a group of mutually parallel two defects. The geometry of the second type is the defects crossing orthogonally each other. The specimen of third type is an actual crack. The PA images are obtained for the specimen with double and crossing defects. Furthermore, the detection of actual surface crack has been performed.

Paper Details

Date Published: 7 May 1999
PDF: 3 pages
Proc. SPIE 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99), (7 May 1999); doi: 10.1117/12.347768
Show Author Affiliations
Haruo Endoh, Tohoku Gakuin Univ. (Japan)
Yoichiro Hiwatashi, Tohoku Gakuin Univ. (Japan)
Tsutomu Hoshimiya, Tohoku Gakuin Univ. (Japan)

Published in SPIE Proceedings Vol. 3740:
Optical Engineering for Sensing and Nanotechnology (ICOSN '99)
Ichirou Yamaguchi, Editor(s)

© SPIE. Terms of Use
Back to Top