Share Email Print

Proceedings Paper

Improvement of precision in the analysis of a lateral shearing interferogram using integration
Author(s): Seiichi Okuda; Takashi Nomura; Kazuhide Kamiya; Hiroshi Miyashiro; Kazuo Yoshikawa; Hatsuzo Tashiro
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

In the method for obtaining an error in a shape under test using the integration from a lateral shearing interferogram, it is assumed that the lateral shear of the shape is so small that the interferogram pattern is considered to be representative of the wavefront slope. To obtain the shape, the slope is analyzed by integration. When the lateral shear of the wavefront is not small, an accurate shape cannot be obtained. Furthermore, the analyzed area of the wavefront is limited by the amount of shear, and the whole area cannot be obtained by this method. A method for reconstructing the whole accurate shape from the wavefront analyzed using the integration process is presented in this paper. In a computer simulation to investigate the efficacy of the method, the reconstructed shape agreed with the original shape error.

Paper Details

Date Published: 7 May 1999
PDF: 4 pages
Proc. SPIE 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99), (7 May 1999); doi: 10.1117/12.347763
Show Author Affiliations
Seiichi Okuda, Toyama Prefectural Univ. (Japan)
Takashi Nomura, Toyama Prefectural Univ. (Japan)
Kazuhide Kamiya, Toyama Prefectural Univ. (Japan)
Hiroshi Miyashiro, Toyama Prefectural Univ. (Japan)
Kazuo Yoshikawa, Toyama Univ. (Japan)
Hatsuzo Tashiro, Toyama Univ. (Japan)

Published in SPIE Proceedings Vol. 3740:
Optical Engineering for Sensing and Nanotechnology (ICOSN '99)
Ichirou Yamaguchi, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?