Proceedings Paper
Birefringence measurement by scattered light method with a phase-shifting technique| Format | Member Price | Non-Member Price |
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Paper Abstract
This paper describes a modified birefringence measurement using the scattered light method combined with a phase shifting technique. A phase shift between orthogonal linear polarization components is realized by a retardation compensator. The measured distribution has a periodical error, which can be reduced by a band pass filtering of the Fourier spectrum of scattered light distribution. This method enables a birefringence distribution on a light path to be obtained.
Paper Details
Date Published: 7 May 1999
PDF: 5 pages
Proc. SPIE 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99), (7 May 1999); doi: 10.1117/12.347713
Published in SPIE Proceedings Vol. 3740:
Optical Engineering for Sensing and Nanotechnology (ICOSN '99)
Ichirou Yamaguchi, Editor(s)
PDF: 5 pages
Proc. SPIE 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99), (7 May 1999); doi: 10.1117/12.347713
Show Author Affiliations
Norihiro Umeda, Tokyo Univ. of Agriculture and Technology (Japan)
Jun Takahashi, Tokyo Univ. of Agriculture and Technology (Japan)
Jun Takahashi, Tokyo Univ. of Agriculture and Technology (Japan)
Daisuke Iiduka, Tokyo Univ. of Agriculture and Technology (Japan)
Hiroyuki Kohwa, Uniopt Co., Ltd. (Japan)
Hiroyuki Kohwa, Uniopt Co., Ltd. (Japan)
Published in SPIE Proceedings Vol. 3740:
Optical Engineering for Sensing and Nanotechnology (ICOSN '99)
Ichirou Yamaguchi, Editor(s)
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