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Proceedings Paper

Multidimensional Raman spectroscopy: from the UV to the near IR
Author(s): Steven M. Barnett; Richard W. Bormett; Andrew Whitley
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Paper Abstract

The structural elucidation of complex systems may be simplified with multi-dimensional spectroscopic techniques with some combination of spatial and spectral resolution. Raman spectroscopy permits the addition of another variable to this scenario -- excitation wavelength. Data obtained using excitation wavelengths from the UV (244 nm) to near-IR (785 nm) regions will be presented showing the qualitative and quantitative study of diamond-like carbon (DLC), silicon, and other systems of an industrial or biomedical nature. The choice of appropriate wavelength provides an additional advantage over other spectroscopic techniques for elucidating specific structural information from these systems. The advantages of UV-Raman for materials science and thin film studies will be considered. The design of instruments and probes for the application of Raman spectroscopy to industrial process control and the development of Raman spectroscopic libraries for contaminant analysis will be discussed.

Paper Details

Date Published: 6 May 1999
PDF: 9 pages
Proc. SPIE 3605, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing VI, (6 May 1999); doi: 10.1117/12.347577
Show Author Affiliations
Steven M. Barnett, Renishaw Inc. (United States)
Richard W. Bormett, Renishaw Inc. (United States)
Andrew Whitley, Renishaw Inc. (United States)

Published in SPIE Proceedings Vol. 3605:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing VI
Dario Cabib; Carol J. Cogswell; Jose-Angel Conchello; Jeremy M. Lerner; Tony Wilson, Editor(s)

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