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Proceedings Paper

Engineering applications of speckle phenomenon
Author(s): Rajpal S. Sirohi
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Paper Abstract

Speckle Phenomenon has been used for the measurement of surface roughness, deformation and shape of the object. Electronic speckle pattern interferometry can deliver the measurement data at the video rate. Some applications of ESPI like defect detection, residual stress measurement etc. are presented.

Paper Details

Date Published: 29 April 1999
PDF: 4 pages
Proc. SPIE 3729, Selected Papers from International Conference on Optics and Optoelectronics '98, (29 April 1999); doi: 10.1117/12.346807
Show Author Affiliations
Rajpal S. Sirohi, National Univ. of Singapore (India)


Published in SPIE Proceedings Vol. 3729:
Selected Papers from International Conference on Optics and Optoelectronics '98
Kehar Singh; Om Prakash Nijhawan; Arun Kumar Gupta; A. K. Musla, Editor(s)

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