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Proceedings Paper

Critical dimension and oxide damage control during poly/polycide etching on a TCP9400SE using the SEERS plasma diagnostic system
Author(s): Michel Derie
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Paper Abstract

The Self Exited Electron Resonance Spectroscopy is a new method of plasma characterization that gives access to collision rate, electron density, sheath width and bulk power. We used that method on a TCP9400SE for Poly/Polycide etching in order to optimize the CD control. To do that, we first checked all possible correlation's between the plasma parameters and the resulting effects on the wafers like side wall polymerization, CD gain, etchrate, oxide loss and oxide damage. Those results were first obtained on test wafers and were then rechecked on product wafers. Both series of experiments were consistent and allowed us to find the mechanism for the side wall polymers growth. Then we could identify the electron density value that gave the best CD control.

Paper Details

Date Published: 23 April 1999
PDF: 10 pages
Proc. SPIE 3742, Process and Equipment Control in Microelectronic Manufacturing, (23 April 1999);
Show Author Affiliations
Michel Derie, ST Microelectronics (France)


Published in SPIE Proceedings Vol. 3742:
Process and Equipment Control in Microelectronic Manufacturing
Kevin Yallup; Murali K. Narasimhan, Editor(s)

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