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Proceedings Paper

Laser megajoule optical components damage threshold measurements with a large-size beamlet laser (Abstract Only)
Author(s): Anne Fornier; Philippe Feru; B. Pinot; Herve Leplan; G. Leroux; Scott C. Burkhart; Timothy L. Weiland
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Paper Abstract

Large components are needed to build up the Laser Megajoule which belongs to the future generation of fusion laser. It is essential to determine the laser damage threshold of full-size components with a large-size laser beam, and to compare this value to the threshold obtained on small samples with a small gaussian laser beam. So, we have, in the first place, tested some small samples from the same coating run on REOSC, CEA and LLNL facilities and, in a second series of experiments, we have tested three full-size optical components on the LLNL beamlet laser. Two types of optical components have been tested on the beamlet: - one polarizer: 710 X 400 nm; - two HfO2/SiO2 mirrors, from the same coating run: 620 X 440 mm. Before beamlet irradiation these components have been continued at 10 ns on the LLNL Plato facility. Concerning the mirrors, two different conditioning procedures have been applied: - on the first mirror a 5-step conditioning procedure; - on the second mirror a 2-step conditioning procedure. Then, each mirror has undergone the same test on the beamlet. In this paper we report the result obtained on the polarizer and the mirrors after beamlet irradiation.

Paper Details

Date Published: 7 April 1999
PDF: 1 pages
Proc. SPIE 3578, Laser-Induced Damage in Optical Materials: 1998, (7 April 1999); doi: 10.1117/12.344454
Show Author Affiliations
Anne Fornier, CEA-Ctr. d'Etudes de Limeil-Valenton (France)
Philippe Feru, CEA-Ctr. d'Etudes de Limeil-Valenton (France)
B. Pinot, SFIM-ODS (France)
Herve Leplan, SFIM-ODS (France)
G. Leroux, SFIM-ODS (France)
Scott C. Burkhart, Lawrence Livermore National Lab. (United States)
Timothy L. Weiland, Lawrence Livermore National Lab. (United States)

Published in SPIE Proceedings Vol. 3578:
Laser-Induced Damage in Optical Materials: 1998
Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; Keith L. Lewis; M. J. Soileau, Editor(s)

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