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Proceedings Paper

Subpicosecond studies of carrier dynamics in laser-induced breakdown
Author(s): Fabien Quere; Stephane Guizard; Philippe Martin; Guillaume Petite; Olivier Gobert; Pierre Meynadier; Michel Perdrix
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Paper Abstract

In this paper, we present measurements of the excited carrier density in various wide band gap oxides irradiated by short laser pulses, at intensities below and above breakdown threshold. This is achieved with the help of time resolved interferometry in the frequency domain, a technique which was successfully used to study the dynamics of photoexcited carriers in insulators. The result obtained in different experimental conditions, distance from the surface, pump intensities and duration, during or after the pump pulse, are discussed and compared to the models recently developed to explain optical breakdown.

Paper Details

Date Published: 7 April 1999
PDF: 11 pages
Proc. SPIE 3578, Laser-Induced Damage in Optical Materials: 1998, (7 April 1999); doi: 10.1117/12.344445
Show Author Affiliations
Fabien Quere, CEA-Saclay (France)
Stephane Guizard, CEA-Saclay (France)
Philippe Martin, CEA-Saclay (France)
Guillaume Petite, CEA-Saclay (France)
Olivier Gobert, CEA-Saclay (France)
Pierre Meynadier, CEA-Saclay (France)
Michel Perdrix, CEA-Saclay (France)

Published in SPIE Proceedings Vol. 3578:
Laser-Induced Damage in Optical Materials: 1998
Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; Keith L. Lewis; M. J. Soileau, Editor(s)

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