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Proceedings Paper

Characteristics of deep-UV optics at 193 nm and 157 nm
Author(s): Glen P. Callahan; Bruce K. Flint
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Paper Abstract

The increasing use of Argon Fluoride (ArF) 193 nm excimer lasers in microlithography, surgical procedures and other applications have created the requirement for an increasingly larger number of specialized optical components and thin film coatings. At 193nm these include coated components that can withstand long duration exposure to UV radiation without significant change in performance. Similar coatings and components for Fluorine lasers operating at 157 nm are under development. At these deep UV wavelengths, potential coating materials as well as substrates are very limited due to absorption and impurities. Characteristics of various types of thin film coatings including reflective, anti-reflective, beam-splitting, beam attenuating and optical bandpass filters, at both 193nm and 157nm, are measured using a specially designed vacuum spectrophotometer system. Results of these measurements as well as plans for further coating development are presented.

Paper Details

Date Published: 7 April 1999
PDF: 9 pages
Proc. SPIE 3578, Laser-Induced Damage in Optical Materials: 1998, (7 April 1999); doi: 10.1117/12.344438
Show Author Affiliations
Glen P. Callahan, Acton Research Corp. (United States)
Bruce K. Flint, Acton Research Corp. (United States)

Published in SPIE Proceedings Vol. 3578:
Laser-Induced Damage in Optical Materials: 1998
Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; Keith L. Lewis; M. J. Soileau, Editor(s)

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