Share Email Print

Proceedings Paper

Combining optical and thermal stresses in multiple-shot laser experiments
Author(s): Guillaume Ravel; Jean Dijon; Philippe Lyan; Oliver Lartigue
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

We report surface damage measurements on single crystal silicon under single and multiple 3 ns pulse laser irradiation at 1.06 micrometers wavelength. First, single shot damage threshold is measured. Then the numbers of pulses required to damage with a probability of 0.5 at various fluences below this 1/1 threshold are obtained at room temperature. These results are fitted with various life models. We look at temperature as a means to accelerate life test. A new feature of the laser test facility in our laboratory is described, allowing surface damage measurements under controlled thermal environment, with testing temperatures ranging from room temperature to 180 Celsius degrees. Experimental demonstration of accelerated failure time for silicon at 1.06 micrometers is provided.

Paper Details

Date Published: 7 April 1999
PDF: 13 pages
Proc. SPIE 3578, Laser-Induced Damage in Optical Materials: 1998, (7 April 1999); doi: 10.1117/12.344396
Show Author Affiliations
Guillaume Ravel, CEA-LETI (France)
Jean Dijon, CEA-LETI (France)
Philippe Lyan, CEA-LETI (France)
Oliver Lartigue, CEA-LETI (France)

Published in SPIE Proceedings Vol. 3578:
Laser-Induced Damage in Optical Materials: 1998
Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; Keith L. Lewis; M. J. Soileau, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?