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Proceedings Paper

Reliability of determination of electron traps depths in crystals using thermoluminescence methods
Author(s): T. Lukas; A. Opanowicz
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Paper Abstract

Fourteen methods of the trap depth determination from the thermoluminescence (TL) curves have been examined by applying these methods to numerically calculated TL curves. The heating-rate methods of Hoogenstraaten, Haering and Adams, Chen and Winer, and Opanowicz yield the correct values of trap depths.

Paper Details

Date Published: 24 March 1999
PDF: 5 pages
Proc. SPIE 3724, International Conference on Solid State Crystals '98: Single Crystal Growth, Characterization, and Applications, (24 March 1999); doi: 10.1117/12.342991
Show Author Affiliations
T. Lukas, Technical Univ. of Lodz (Poland)
A. Opanowicz, Technical Univ. of Lodz (Poland)


Published in SPIE Proceedings Vol. 3724:
International Conference on Solid State Crystals '98: Single Crystal Growth, Characterization, and Applications
Andrzej Majchrowski; Jerzy Zielinski, Editor(s)

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