Share Email Print

Proceedings Paper

Improving the processing speed of an optoelectronic morphological industrial inspection processor
Author(s): Haisong Liu; Minxian Wu; Guofan Jin; Qingsheng He; Yingbai Yan
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

In this paper, we present several methods to improve the processing speed of an optoelectronic morphological industrial inspection processor, which uses an incoherent correlator as its optical hardware and the extensive complementary encoding morphological hit-or-miss transform as its detection algorithm. The first method is using a multi-channel correlation scheme, in which four database images are processed simultaneously so that the LCD panel needs only update 25 times for a set of 100 images, for instance. The second method is using a postprocessing method for the optical correlation output plane. An absolute difference measurement algorithm is applied for measuring the similarity of the optical correlation resultant images, and then the similarity between the tested and the reference image can be deduced. By this method, the complicated preprocessing procedure including the extensive complementary encoding can be simplified because we can directly deal with the gray-scale images. The third method is using a photorefractive correlator instead of the incoherent correlator so that their is not the update rate limitation of the LCD panel, which was a main problem facing any optoelectronic hybrid system.

Paper Details

Date Published: 8 March 1999
PDF: 8 pages
Proc. SPIE 3652, Machine Vision Applications in Industrial Inspection VII, (8 March 1999); doi: 10.1117/12.341140
Show Author Affiliations
Haisong Liu, Tsinghua Univ. (United States)
Minxian Wu, Tsinghua Univ. (China)
Guofan Jin, Tsinghua Univ. (China)
Qingsheng He, Tsinghua Univ. (China)
Yingbai Yan, Tsinghua Univ. (China)

Published in SPIE Proceedings Vol. 3652:
Machine Vision Applications in Industrial Inspection VII
Kenneth W. Tobin Jr.; Ning S. Chang, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?