Share Email Print

Proceedings Paper

Imaging tristimulus colorimeter for the evaluation of color in printed textiles
Author(s): Martin A. Hunt; James S. Goddard Jr.; Kathy W. Hylton; Thomas P. Karnowski; Roger K. Richards; Marc L. Simpson; Kenneth W. Tobin Jr.; Dale A. Treece
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The high-speed production of textiles with complicated printed patterns presents a difficult problem for a colorimetric measurement system. Accurate assessment of product quality requires a repeatable measurement using a standard color space, such as CIELAB, and the use of a perceptually based color difference formula, e.g. (Delta) ECMC color difference formula. Image based color sensors used for on-line measurement are not colorimetric by nature and require a non-linear transformation of the component colors based on the spectral properties of the incident illumination, imaging sensor, and the actual textile color. This research and development effort describes a benchtop, proof-of-principle system that implements a projection onto convex sets (POCS) algorithm for mapping component color measurements to standard tristimulus values and incorporates structural and color based segmentation for improved precision and accuracy. The POCS algorithm consists of determining the closed convex sets that describe the constraints on the reconstruction of the true tristimulus values based on the measured imperfect values. We show that using a simulated D65 standard illuminant, commercial filters and a CCD camera, accurate (under perceptibility limits) per-region based (Delta) ECMC values can be measured on real textile samples.

Paper Details

Date Published: 8 March 1999
PDF: 11 pages
Proc. SPIE 3652, Machine Vision Applications in Industrial Inspection VII, (8 March 1999);
Show Author Affiliations
Martin A. Hunt, Oak Ridge National Lab. (United States)
James S. Goddard Jr., Oak Ridge National Lab. (United States)
Kathy W. Hylton, Oak Ridge National Lab. (United States)
Thomas P. Karnowski, Oak Ridge National Lab. (United States)
Roger K. Richards, Oak Ridge National Lab. (United States)
Marc L. Simpson, Oak Ridge National Lab. (United States)
Kenneth W. Tobin Jr., Oak Ridge National Lab. (United States)
Dale A. Treece, Oak Ridge National Lab. (United States)

Published in SPIE Proceedings Vol. 3652:
Machine Vision Applications in Industrial Inspection VII
Kenneth W. Tobin Jr.; Ning S. Chang, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?