Share Email Print

Proceedings Paper

Index of refraction modifications accompanying absorptive optical bistability in a semiconductor doped glass filter
Author(s): F. Pereira; Michael Scott Belsley; J. Ribeira Salcedo
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

We have characterized the transverse spatial dependence of the real and imaginary parts of the complex nonlinear refractive index of a semiconductor doped glass filter, which exhibits absorptive bistability. Using the Z-scan technique, combined with an interferometric measurement of the integrated optical thickness, we are able to fit the observed experimental data assuming a quadratically varying transverse temperature profile in the sample. The transverse variations in the nonlinear refractive index do not scale directly with the size of the incident beam, but exhibit marked asymmetries depending on whether the incident beam is converging or diverging.

Paper Details

Date Published: 28 January 1999
PDF: 9 pages
Proc. SPIE 3733, ICONO '98: Nonlinear Optical Phenomena and Coherent Optics in Information Technologies, (28 January 1999); doi: 10.1117/12.340059
Show Author Affiliations
F. Pereira, Instituto Politecnico do Porto (Portugal) and INESC Porto (Portugal)
Michael Scott Belsley, Univ. do Minho (Portugal)
J. Ribeira Salcedo, Univ. do Porto (Portugal)

Published in SPIE Proceedings Vol. 3733:
ICONO '98: Nonlinear Optical Phenomena and Coherent Optics in Information Technologies
Sergei S. Chesnokov; Valerii P. Kandidov; Nikolai I. Koroteev, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?