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Proceedings Paper

Optical nanoprobes for scanning near-field optical microscopy: functions, requirements, fabrication, and theoretical reconstruction from far-field investigation
Author(s): Vadim P. Veiko; V. M. Voronin; Nikolay B. Voznesensky; Sergey A. Rodionov; Igor B. Smirnov; Alexey I. Kalachev
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Paper Abstract

Various kinds of nanoprobes for scanning near-field optical microscopy with the requirements and peculiarities of fabrication are discussed. A set up for fabrication of fiber made tips is presented and new ideas of optical superresolution technique for SNOM subwavelength apertures recognition is suggested.

Paper Details

Date Published: 20 January 1999
PDF: 9 pages
Proc. SPIE 3688, 6th International Conference on Industrial Lasers and Laser Applications '98, (20 January 1999); doi: 10.1117/12.337544
Show Author Affiliations
Vadim P. Veiko, St. Petersburg Institute of Fine Mechanics and Optics (Russia)
V. M. Voronin, St. Petersburg Institute of Fine Mechanics and Optics (Russia)
Nikolay B. Voznesensky, St. Petersburg Institute of Fine Mechanics and Optics (Russia)
Sergey A. Rodionov, St. Petersburg Institute of Fine Mechanics and Optics (Russia)
Igor B. Smirnov, St. Petersburg Institute of Fine Mechanics and Optics (Russia)
Alexey I. Kalachev, St. Petersburg Institute of Fine Mechanics and Optics (Russia)


Published in SPIE Proceedings Vol. 3688:
6th International Conference on Industrial Lasers and Laser Applications '98
Vladislav Ya. Panchenko; Vladimir S. Golubev, Editor(s)

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