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Proceedings Paper

Implementation of an actively controlled white light interferometer for measurement of subwavelength structural disturbances
Author(s): Karl N. Schrader
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Paper Abstract

A system is presented for sensing nanometer scale structural disturbances using white light interferometry in conjunction with a tracking controller. A Michelson interferometer is established using a fiber-coupled white light source, a beamsplitter cube, an actuated reference mirror, and a retroreflector attached to the structure of interest. Structural motion is determined by actively tracking the zeroth order white light interference fringe. A multimode controller architecture enables location of the white light fringe packet, coarse tracking of the packet by modulation of the actuated mirror, and fine tracking by locking onto the slope of the zeroth order fringe. Resolution and bandwidth of the measurement system is increased at each successive mode. Experimental results of the system prototype are presented. Applications include position control of optical elements in segmented aperture imaging systems such as the Next Generation Space Telescope and the USAF Research Lab UltraLITE space imager.

Paper Details

Date Published: 8 December 1998
PDF: 11 pages
Proc. SPIE 3430, Novel Optical Systems and Large-Aperture Imaging, (8 December 1998); doi: 10.1117/12.332484
Show Author Affiliations
Karl N. Schrader, Nichols Research Corp. (United States)

Published in SPIE Proceedings Vol. 3430:
Novel Optical Systems and Large-Aperture Imaging
Kevin Dean Bell; Michael K. Powers; Jose M. Sasian, Editor(s)

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