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Proceedings Paper

Simulation of an actively controlled white light interferometer for measurement of subwavelength structural disturbances
Author(s): Karl N. Schrader; Lawrence Robertson III
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Paper Abstract

A detailed simulation of a white light interferometer system for measuring nanometer scale structural motion is presented. Two operational methods are studied: low bandwidth, low resolution centroid tracking of the structure motion, and fine resolution, high bandwidth fringe tracking. A Michelson interferometer is modeled with one optical path containing a target mirror attached to the structure, and the second path containing a voice coil actuated reference mirror for path length difference control. Simulation results reveal a 3 nanometer RMS error for a 1 micron, 100 Hz structure motion during fringe tracking. This system is being developed at the Air Force Research Laboratory, Space Vehicles Directorate, under the UltraLITE program as part of an imaging spacecraft brassboard demonstration that requires 12 nanometer RMS absolute piston control.

Paper Details

Date Published: 8 December 1998
PDF: 11 pages
Proc. SPIE 3430, Novel Optical Systems and Large-Aperture Imaging, (8 December 1998); doi: 10.1117/12.332483
Show Author Affiliations
Karl N. Schrader, Nichols Research Corp. (United States)
Lawrence Robertson III, Nichols Research Corp. (United States)


Published in SPIE Proceedings Vol. 3430:
Novel Optical Systems and Large-Aperture Imaging
Kevin Dean Bell; Michael K. Powers; Jose M. Sasian, Editor(s)

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