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Proceedings Paper

Analysis and modeling of anomalous scattering in the AXAF HETGS
Author(s): John E. Davis; Herman L. Marshall; Daniel Dewey; Mark L. Schattenburg
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Paper Abstract

Tests of the High-Energy Transmission Grating Spectrometer (HETGS) for the Advanced X-Ray Astrophysics Facility (AXAF) showed anomalous scattering of monochromatic radiation. The grating resolving power (E/dE) is of the order 1000, but test designed to search for small-angle scattering by the gratings showed events with significant deviations from the dispersed grating orders and concentrated along the dispersion direction. In this paper, we present a general overview of grating scatter as a result of fluctuations in the grating bar geometry. The grating scatter observed at the AXAF-X-Ray Calibration Facility is shown to be consistent with what one expects from scatter due to deviations in the grating bar geometry form perfect bars. For the purposes of modeling, a rectangular bar mode is adopted and bar parameters are deduced via fitting the model to the scattering data. The correlations deduce from this model lead to a simple physical picture of grating bar fluctuations where a small fraction of the bars, e.g., 1 in 200 are leaning.

Paper Details

Date Published: 19 November 1998
PDF: 17 pages
Proc. SPIE 3444, X-Ray Optics, Instruments, and Missions, (19 November 1998); doi: 10.1117/12.331288
Show Author Affiliations
John E. Davis, Massachusetts Institute of Technology (United States)
Herman L. Marshall, Massachusetts Institute of Technology (United States)
Daniel Dewey, Massachusetts Institute of Technology (United States)
Mark L. Schattenburg, Massachusetts Institute of Technology (United States)

Published in SPIE Proceedings Vol. 3444:
X-Ray Optics, Instruments, and Missions
Richard B. Hoover; Arthur B. C. Walker II, Editor(s)

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