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Proceedings Paper

Use of x-ray optical systems in a small diffractometer
Author(s): Alexander V. Liutcau; Alexander V. Kotelkin; Alexander D. Zvonkov; Dimitrii B. Mateev; Svetlana V. Nikitina; Nariman S. Ibraimov
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Paper Abstract

The use of Kumakhov halflenses in a small diffractometers with position-sensitive detector for the investigation of stress-deformation state is considered. The possibility of obtaining the system of parallel beam with a small angular divergence allows to estimate the state of stress- deformation in a various sections of object under investigation, owing to drawing near or moving away x-ray tube connected with the halflens. It is shown, that the new method should be very interesting for determination of the reliability of a real articles.

Paper Details

Date Published: 19 November 1998
PDF: 3 pages
Proc. SPIE 3444, X-Ray Optics, Instruments, and Missions, (19 November 1998); doi: 10.1117/12.331268
Show Author Affiliations
Alexander V. Liutcau, Institute of Steel and Alloys (Russia)
Alexander V. Kotelkin, Institute of Steel and Alloys (Russia)
Alexander D. Zvonkov, Institute of Steel and Alloys (Russia)
Dimitrii B. Mateev, Institute of Steel and Alloys (Russia)
Svetlana V. Nikitina, Institute for Roentgen Optics (Russia)
Nariman S. Ibraimov, Institute for Roentgen Optics (Russia)

Published in SPIE Proceedings Vol. 3444:
X-Ray Optics, Instruments, and Missions
Richard B. Hoover; Arthur B. C. Walker II, Editor(s)

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