Proceedings Paper
Metrology of a mirror at the Advanced Photon Source: comparison between optical and x-ray measurements| Format | Member Price | Non-Member Price |
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Paper Abstract
This paper describes metrology of a vertically focusing mirror on the bending magnet beamline in sector-1 of the Advanced Photon Source, Argonne National Laboratory. The mirror was evaluated using measurements from both an optical long trace profiler and x-rays. Slope error profiles obtained with the two methods were compared and were found to be in a good agreement. Further comparisons were made between x-ray measurements and results from the SHADOW ray-tracing code.
Paper Details
Date Published: 13 November 1998
PDF: 8 pages
Proc. SPIE 3447, Advances in Mirror Technology for Synchrotron X-Ray and Laser Applications, (13 November 1998);
Published in SPIE Proceedings Vol. 3447:
Advances in Mirror Technology for Synchrotron X-Ray and Laser Applications
Ali M. Khounsary, Editor(s)
PDF: 8 pages
Proc. SPIE 3447, Advances in Mirror Technology for Synchrotron X-Ray and Laser Applications, (13 November 1998);
Show Author Affiliations
Lahsen Assoufid, Argonne National Lab. (United States)
Jonathan C. Lang, Argonne National Lab. (United States)
Jonathan C. Lang, Argonne National Lab. (United States)
Published in SPIE Proceedings Vol. 3447:
Advances in Mirror Technology for Synchrotron X-Ray and Laser Applications
Ali M. Khounsary, Editor(s)
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