Share Email Print
cover

Proceedings Paper

Error reduction techniques for measuring long synchrotron mirrors
Author(s): Steven C. Irick
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Error reduction techniques for the long trace profiler are presented. Techniques that have been used for years are critiqued, and new methods are suggested.

Paper Details

Date Published: 13 November 1998
PDF: 8 pages
Proc. SPIE 3447, Advances in Mirror Technology for Synchrotron X-Ray and Laser Applications, (13 November 1998);
Show Author Affiliations
Steven C. Irick, Lawrence Berkeley National Lab. (United States)


Published in SPIE Proceedings Vol. 3447:
Advances in Mirror Technology for Synchrotron X-Ray and Laser Applications
Ali M. Khounsary, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray