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Proceedings Paper

Influence of the refractive profile of a waveguide on the sensitivity of a planar difference interferometer
Author(s): Roman Rogozinski; Kazimierz Gut; Pawel Karasinski; Zbigniew Opilski; Aleksander Opilski
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Paper Abstract

The work presents the possibility to control the changes involving the difference of the propagation of waveguide modes TE0, TM0, TM1 by respective selection of technological parameters while producing the optics channel of the planar interferometer by ion-exchange technique in glass. The influence of the refractive profile of waveguide structure on the sensitivity of interferometer was observed.

Paper Details

Date Published: 11 November 1998
PDF: 7 pages
Proc. SPIE 3581, Acousto-Optics and Applications III, (11 November 1998); doi: 10.1117/12.330505
Show Author Affiliations
Roman Rogozinski, Silesian Technical Univ. (Poland)
Kazimierz Gut, Silesian Technical Univ. (Poland)
Pawel Karasinski, Silesian Technical Univ. (Poland)
Zbigniew Opilski, Silesian Technical Univ. (Poland)
Aleksander Opilski, Silesian Technical Univ. (Poland)

Published in SPIE Proceedings Vol. 3581:
Acousto-Optics and Applications III
Antoni Sliwinski; Bogumil B. J. Linde; Piotr Kwiek, Editor(s)

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