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Proceedings Paper

Using x-ray microprobes for environmental research
Author(s): Ken M. Kemner; Wenbing Yun; Zhonghou Cai; Barry P. Lai; Heung-Rae Lee; Dan G. Legnini; W. Rodrigues; Julie D. Jastrow; R. M. Miller; Stephan T. Pratt; M. A. Schneegurt; C. F. Kulpa Jr.; Alvin J. M. Smucker
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Paper Abstract

Understanding the fate of environmental contaminants is of fundamental importance in the development and evaluation of effective remediation strategies. Among the factors influencing the transport of these contaminants are the chemical speciation of the sample and the chemical and physical attributes of the surrounding medium. Characterization of the spatial distribution and chemical speciation at micron and submicron resolution is essential for studying the microscopic physical, geological, chemical, and biological interfaces that play a crucial role in determining contaminant fate and mobility. Hard x-ray spectroscopy and imaging are powerful techniques for the element-specific investigation of complex environmental samples at the needed micron and submicron resolution. An important advantage of these techniques result from the large penetration depth of hard x-rays in water. This minimizes the requirements for sample preparation and allows the detailed study of hydrated samples. This paper discuses some current problems in environmental science that can be addressed by using synchrotron- based x-ray imaging and spectroscopy. These concepts are illustrated by the results of recent x-ray microscopy studies at the Advanced Photon Source.

Paper Details

Date Published: 6 November 1998
PDF: 10 pages
Proc. SPIE 3449, X-Ray Microfocusing: Applications and Techniques, (6 November 1998); doi: 10.1117/12.330354
Show Author Affiliations
Ken M. Kemner, Argonne National Lab. (United States)
Wenbing Yun, Argonne National Lab. (United States)
Zhonghou Cai, Argonne National Lab. (United States)
Barry P. Lai, Argonne National Lab. (United States)
Heung-Rae Lee, Argonne National Lab. (United States)
Dan G. Legnini, Argonne National Lab. (United States)
W. Rodrigues, Argonne National Lab. (United States)
Julie D. Jastrow, Argonne National Lab. (United States)
R. M. Miller, Argonne National Lab. (United States)
Stephan T. Pratt, Argonne National Lab. (United States)
M. A. Schneegurt, Univ. of Notre Dame (United States)
C. F. Kulpa Jr., Univ. of Notre Dame (United States)
Alvin J. M. Smucker, Michigan State Univ. (United States)

Published in SPIE Proceedings Vol. 3449:
X-Ray Microfocusing: Applications and Techniques
Ian McNulty, Editor(s)

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