Share Email Print

Proceedings Paper

XMM flight mirror modules with reflection grating assembly and x-ray baffle testing
Author(s): Yvan Stockman; Isabelle Domken; Hebert Hansen; Jean Philippe Tock; Todd R. Decker; Andrew P. Rasmussen; Antonius J. F. den Boggende; Jan-Willem den Herder; Frits B. S. Paerels; G. Bagnasco; Daniel de Chambure; Christian Erd; Philippe Gondoin
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

In the frame of the XMM project, several test campaigns are accomplished to qualify the optical elements of the mission. The test described in this paper are performed on a XMM flight model mirror module added with a reflection grating assembly (RGA). The mirror module contains 58 x-ray optical quality shells, an x-ray baffle (XRB) to reduce the straylight. This complete XMM flight model mirror assembly (MA) is tested in a vertical configuration at CSL, in a full aperture or partial EUV collimated beam illumination, and with an x-ray pencil beam. One of the advantages of the EUV collimated beam is to verify the correct position of the RGA when integrated in flight configuration on the mirror module structure. This is not possible in x-ray with a finite source distance. The partial EUV illumination is performed to verify the correct integration of the RGA grating stacks. The pencil beam allows to make an accurate metrology of the XRB position, and to verify the positions of the 0, 1 and 2 diffraction order foci. In this paper, the tested module is first exposed, and the approach to qualify the instrument is described. The analysis of the results achieved over the different test configurations is presented. The impact of the environmental test on the reflection grating box is also diagnosed.

Paper Details

Date Published: 10 November 1998
PDF: 11 pages
Proc. SPIE 3445, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX, (10 November 1998); doi: 10.1117/12.330313
Show Author Affiliations
Yvan Stockman, Univ. of Liege (Belgium)
Isabelle Domken, Univ. of Liege (Belgium)
Hebert Hansen, Univ. of Liege (Belgium)
Jean Philippe Tock, Univ. of Liege (Belgium)
Todd R. Decker, Columbia Univ. (United States)
Andrew P. Rasmussen, Columbia Univ. (United States)
Antonius J. F. den Boggende, Space Research Organization Netherlands (Netherlands)
Jan-Willem den Herder, Space Research Organization Netherlands (Netherlands)
Frits B. S. Paerels, Space Research Organization Netherlands (United States)
G. Bagnasco, European Space Agency/ESTEC (Netherlands)
Daniel de Chambure, European Space Agency/ESTEC (Netherlands)
Christian Erd, European Space Agency/ESTEC (Netherlands)
Philippe Gondoin, European Space Agency/ESTEC (Netherlands)

Published in SPIE Proceedings Vol. 3445:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX
Oswald H. W. Siegmund; Mark A. Gummin, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?