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Proceedings Paper

Synchrotron measurements of the absolute x-ray quantum efficiency of CsI-coated microchannel plates
Author(s): Rob M. Rideout; James F. Pearson; George W. Fraser; John Ernest Lees; Adam N. Brunton; Nigel P. Bannister; Almus T. Kenter; Ralph Porter Kraft
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Paper Abstract

Two identical CsI-coated, low noise microchannel plate (MCP) detectors were taken to the Daresbury Synchrotron Radiation Source (SRS) to measure their quantum efficiencies over two different energy ranges - 450 eV to 1200 eV and 4.5 eV to 9.5 eV. The SRS was run in low ring current with the beam flux monitored using single wire gas proportional counters. We present accurate measurements of edge-related absolute quantum efficiency features due to the CsI photocathodes. This data will be incorporated into the calibration program of the Advanced X-ray Astrophysical Facility High Resolution Camera.

Paper Details

Date Published: 10 November 1998
PDF: 9 pages
Proc. SPIE 3445, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX, (10 November 1998); doi: 10.1117/12.330297
Show Author Affiliations
Rob M. Rideout, Univ. of Leicester (United Kingdom)
James F. Pearson, Univ. of Leicester (United Kingdom)
George W. Fraser, Univ. of Leicester (United Kingdom)
John Ernest Lees, Univ. of Leicester (United Kingdom)
Adam N. Brunton, Univ. of Leicester (United Kingdom)
Nigel P. Bannister, Univ. of Leicester (United Kingdom)
Almus T. Kenter, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Ralph Porter Kraft, Harvard-Smithsonian Ctr. for Astrophysics (United States)

Published in SPIE Proceedings Vol. 3445:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX
Oswald H. W. Siegmund; Mark A. Gummin, Editor(s)

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