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Proceedings Paper

Computation of the intensity distribution for a film on a GRIN substrate
Author(s): Mario Marcelo Lehman; Mario Garavaglia
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Paper Abstract

A theoretical formalism to study the scattering by reflection from a vitreous film on a planar medium with graded refraction index is developed. It is employed the impedance function, which characterizes the interface between two media and the diffuse diffraction pattern is obtained The medium is characterized using the function sech(x) in the refraction index and then, general and particular conclusions can be obtained starting from the surface impedance function.

Paper Details

Date Published: 30 October 1998
PDF: 11 pages
Proc. SPIE 3426, Scattering and Surface Roughness II, (30 October 1998); doi: 10.1117/12.328471
Show Author Affiliations
Mario Marcelo Lehman, Univ. Nacional del Sur (Argentina)
Mario Garavaglia, Univ. Nacional de La Plata and Ctr. de Investigaciones Opticas (Argentina)

Published in SPIE Proceedings Vol. 3426:
Scattering and Surface Roughness II
Zu-Han Gu; Alexei A. Maradudin, Editor(s)

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