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Proceedings Paper

New model for optimization of erasure time in reversible optical memories including shape factor, temperature, and mass effects on incubation time in various nucleation processes
Author(s): Swati Nagpal; Promod K. Bhatnagar; Pankaj Pathak
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Paper Abstract

Work is in progress for improving the switching times of erasable as well as DOW type of optical memories. As it has been already established that the erasure time (ayieldsc) is dominated by incubation time ((tau) ), hence (tau) needs to be explored more in depth. In the present work the mass, molecular diameter and density effects have been shown in addition to the temperature effects. The earlier calculations could only estimate the value of (tau) using a range of critical radii values, whereas the present model can be used to calculate the exact values of critical radii using shape factor calculations for grain boundary, grain edge and grain corner nucleation separately. Knowing the material parameter of a system, one can calculate variation of (tau) with temperature, mass or composition.

Paper Details

Date Published: 23 October 1998
PDF: 3 pages
Proc. SPIE 3401, Optical Data Storage '98, (23 October 1998); doi: 10.1117/12.327948
Show Author Affiliations
Swati Nagpal, University of Delhi (United States)
Promod K. Bhatnagar, Univ. of Delhi South Campus (India)
Pankaj Pathak, Univ. of Delhi South Campus (India)

Published in SPIE Proceedings Vol. 3401:
Optical Data Storage '98
Shigeo R. Kubota; Tomas D. Milster; Paul J. Wehrenberg, Editor(s)

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