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Proceedings Paper

Scanning near-field optical microscopy: transfer function and resolution limit
Author(s): Peter Blattner; Peter Kipfer; Hans Peter Herzig; Rene Daendliker
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Paper Abstract

We present scanning near-field optical microscopy as an optical instrument characterized by a transfer function. This approach gives some theoretical guidelines for the design of near-field optical measurement systems. We emphasize that it is important to distinguish between the resolution for the optical field and the resolution for the object. In addition, we discuss the evanescent-to- propagating conversion capability of different probe tips.

Paper Details

Date Published: 13 October 1998
PDF: 5 pages
Proc. SPIE 3467, Far- and Near-Field Optics: Physics and Information Processing, (13 October 1998); doi: 10.1117/12.326824
Show Author Affiliations
Peter Blattner, Univ. of Neuchatel (Switzerland)
Peter Kipfer, Univ. of Neuchatel (Switzerland)
Hans Peter Herzig, Univ. of Neuchatel (Switzerland)
Rene Daendliker, Univ. of Neuchatel (Switzerland)

Published in SPIE Proceedings Vol. 3467:
Far- and Near-Field Optics: Physics and Information Processing
Suganda Jutamulia; Toshimitsu Asakura, Editor(s)

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