Intelligent Debris Analysis (IDA) requires significant time and resources due to the large number of images to be processed. To address this problem, we propose a hybrid optoelectronic and computer vision approach. Two major steps are involved for IDA: patch-level analysis and particle level analysis. An optoelectronic detection system using two ferroelectric liquid crystal spatial light modulators is designed and constructed to perform path-level analysis, and advanced computer vision techniques are developed to carry out more intelligent particle-level analysis. Since typically only a small portion of the debris filters require more sophisticated particle-level analysis, the proposed approach enables high-speed automated analysis of debris filters due to the inherent parallelism provided by the optoelectronic system.

Date Published: 9 October 1998
PDF: 10 pages
Proc. SPIE 3466, Algorithms, Devices, and Systems for Optical Information Processing II, (9 October 1998); doi: 10.1117/12.326773

Published in SPIE Proceedings Vol. 3466:
Algorithms, Devices, and Systems for Optical Information Processing II
Bahram Javidi; Demetri Psaltis, Editor(s)